General description The Kennedy 75-100mm External Micrometer is designed for precision measurement with an enamelled frame and tungsten carbide tipped anvils, ensuring durability and accuracy. Technical specifications Measuring Range: 75 - 100mm Graduations: 0.010mm Flatness: 0.6mm Parallelism: (2 + L/100) m (fraction rounded down) Instrumental error: (1 + L/75) m (fraction rounded up) Weight: 530g Manufactured to: BS 870 Compatibility and accessories Includes: Durable plastic case Other information